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Wheat Information
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Number 87: 27-30 (1998)
Research article
Seedling
copper tolerance and cytogenetic characterization of
wheat-Aegilops ovata hybrid lines
S.
Landjeva1, M. Merakchijska2, and G.
Ganeva1
1Institute of Genetics, 2Institute of Plant
Physiology, Bulgarian Academy of Sciences, Sofia 1113, Bulgaria (E-
mail: landjev@bgearn.acad.bg)
Summary
Two wheat-Aegilops ovata advanced backcross-derived lines
showed good tolerance at seedling stage to high concentrations of
copper ions in solution (10-6 M and 10-5 M
CuSO4.8H2O). Both lines were established to
carry a pair of sub-metacentric Ae. ovata chromosomes as
substitution for wheat D-genome chromosomes. The alien chromosome
pair is supposed to be 3U according to its specific N-banding
pattern.
Key words: wheat, Aegilops ovata, copper tolerance,
N-banding
Introduction
Many wild relatives of wheat have been reported as donors of
metal stress tolerance and have been exploited for wheat improvement
(reviewed in Manyowa and Miller 1991; MuJeeb-Kazi et al. 1995).
Aegilops ovata L. (syn. Aegilops geniculata Roth.,
Triticum ovatum (L.) Raspail, 2n=28,
UUM0M0) was involved in breeding programmes as
a donor of genes for early maturity, winter hardiness, high grain
protein content, and disease resistance (Bochev 1988). Several
wheat-Aegilops ovata addition and substitution lines have been
developed in bread wheat cultivar Chinese Spring (Landjeva and Ganeva
1997). The present study deals with the tolerance of six of them to
high concentrations of Cu ions. An Aegilops ovata chromosome
is supposed to contribute to the better tolerance of two of
lines.
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